次の形式のSMARTテストに失敗したドライブがあります。
smartctl -a /dev/sdc:
...
# 1 Short offline Completed: read failure 50% 6354 4377408
# 2 Extended offline Completed: read failure 90% 6354 4377408
その後、この「セクタ」を不良として表示したいので、ここに多くのデータを書き込めばよいと仮定します。だから私はddいくつかのゼロを書きました。これはドライブがいっぱいになり、その後別のスマートテストを実行しました。
正常に完了しましたが、SMART 属性を見ると変更はありません。
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
常にドライブの故障の危険があることをよく知っていることに加えて、上記の情報はドライブの故障に関連していますか？
smartctl属性の前後の違いは次のとおりです。
diff --git a/x.txt b/x.txt
index 4cfe1b7..1bcace5 100644
--- a/x.txt
+++ b/x.txt
@@ -12,7 +12,7 @@ Sector Sizes: 512 bytes logical, 4096 bytes physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.0, 3.0 Gb/s (current: 3.0 Gb/s)
-Local Time is: Sun Feb 24 16:50:01 2019 GMT
+Local Time is: Mon Feb 25 18:33:35 2019 GMT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
@@ -55,31 +55,38 @@ SCT capabilities: (0x70b5) SCT Status supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
- 3 Spin_Up_Time 0x0027 180 179 021 Pre-fail Always - 5991
- 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 114
+ 1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 4
+ 3 Spin_Up_Time 0x0027 177 177 021 Pre-fail Always - 6116
+ 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 116
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
- 9 Power_On_Hours 0x0032 092 092 000 Old_age Always - 6356
+ 9 Power_On_Hours 0x0032 092 092 000 Old_age Always - 6372
10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0
- 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 57
+ 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 59
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 46
-193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 67
-194 Temperature_Celsius 0x0022 122 114 000 Old_age Always - 28
+193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 69
+194 Temperature_Celsius 0x0022 116 114 000 Old_age Always - 34
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
-200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 1
+200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
-# 1 Short offline Completed: read failure 50% 6354 4377408
-# 2 Extended offline Completed: read failure 90% 6354 4377408
+# 1 Extended offline Completed without error 00% 6367 -
+# 2 Short offline Completed: read failure 60% 6361 4377409
+# 3 Short offline Completed: read failure 50% 6361 4377409
+# 4 Extended offline Completed: read failure 90% 6359 4377409
+# 5 Short offline Completed without error 00% 6359 -
+# 6 Short offline Completed: read failure 60% 6356 4377409
+# 7 Short offline Completed: read failure 50% 6354 4377408
+# 8 Extended offline Completed: read failure 90% 6354 4377408
+6 of 6 failed self-tests are outdated by newer successful extended offline self-test # 1
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
電流出力smartctl -a：
smartctl 6.6 2018-12-05 r4851 [x86_64-linux-4.14.98] (local build)
Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital AV-GP (AF)
Device Model: WDC WD20EURS-63SPKY0
Serial Number: WD-WMC1T2763021
LU WWN Device Id: 5 0014ee 6addb4b7c
Firmware Version: 80.00A80
User Capacity: 2,000,398,934,016 bytes [2.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.0, 3.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Mon Feb 25 18:49:12 2019 GMT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (27240) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 275) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x70b5) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 4
3 Spin_Up_Time 0x0027 177 177 021 Pre-fail Always - 6116
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 116
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 092 092 000 Old_age Always - 6373
10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 59
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 46
193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 69
194 Temperature_Celsius 0x0022 116 114 000 Old_age Always - 34
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 6367 -
# 2 Short offline Completed: read failure 60% 6361 4377409
# 3 Short offline Completed: read failure 50% 6361 4377409
# 4 Extended offline Completed: read failure 90% 6359 4377409
# 5 Short offline Completed without error 00% 6359 -
# 6 Short offline Completed: read failure 60% 6356 4377409
# 7 Short offline Completed: read failure 50% 6354 4377408
# 8 Extended offline Completed: read failure 90% 6354 4377408
6 of 6 failed self-tests are outdated by newer successful extended offline self-test # 1
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
ベストアンサー1
いいえ、不良セクタとして表示したくありません。読めないセクタに書きたいです:)
昨日引用したようにsmartctlが完全な状態テストに合格したと報告しましたが、テストに失敗しましたか？
ディスクが単一の読み取りでそのセクタからデータを読み取ることができ、破損が一時的ではなく永続的な場合、ディスクファームウェアはそのセクタを「不良」とマークし、それを置き換えるためのスペアセクタを割り当てます。ただし、ディスクがそのセクタを一度も読み取れない場合、セクタは再割り当てされません。、将来のある時点でデータを読み取ることができることを願っています。読み取れない（破損した）セクタに書き込むと問題が解決します。破損が一時的な場合、新しい一貫したデータがそのセクタに書き込まれます。損傷が永続的である場合、書き込みはセクタの再割り当てを強制します。
（太字の部分は私が自分で書いたものです。元のソース：スマートモントゥルズFAQ)
昨日は再割り当てされたセクタがなく、今日も再割り当てされたセクタはありません。Raw_Read_Error_Rateこれは、不良セクタの数が4つに達するという事実を無視すると、ディスクの不良セクタが「同じで正常」であることを意味します。オフラインテストで発生した問題ですか？
しかし、テスト1と5で読めないセクタを修正しました。これはいいですね。ところが不思議な点はテスト２～４も失敗したという点だ。
うーん、おそらくいくつかのテストを実行し、何が起こるのかを見てみましょう。そして、Raw_Read_Error_Rateテストを実行するとき、またはddを使用してゼロを書き込むときに注意してください。