実行すると、次の行がありますdf。
/dev/sda4 47G 45G 0 /
デバイスに空き領域がないというエラーメッセージがすべて表示されます。システムを再起動しましたが、何も変更されませんでした。まだ無料のinodeがあります（約30％使用されています）。運転知能はすべてが大丈夫だと伝えます。
なぜですか？どうすれば修正できますか？ファイルを削除しても空き容量が増えません。
出力lsblk --fs：
NAME FSTYPE LABEL UUID MOUNTPOINT
sda
├─sda1 vfat EFI 67E3-17ED
├─sda2 ext4 data 05fb1d77-ca58-482c-be30-d1bc23a2e7d0 /home/enedil/data
├─sda3 hfsplus Linux HFS+ ESP 96a17c8a-ac44-30f3-b436-ff173b605c74 /boot/efi
└─sda4 ext4 e0b1deed-2cf8-4967-a813-538affd72a75 /
以下は私が要求したコマンドの結果です。
これは再びsmartctl -s on -a /dev/sda：
~ $ sudo smartctl -s on -a /dev/sda
smartctl 6.6 2017-11-05 r4594 [x86_64-linux-4.20.15-100.fc28.x86_64] (local build)
Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Apple SD/SM/TS...E/F/G SSDs
Device Model: APPLE SSD SM0128G
Serial Number: S23CNYAG426087
LU WWN Device Id: 5 002538 900000000
Firmware Version: BXW1JA0Q
User Capacity: 121,332,826,112 bytes [121 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Mar 26 01:56:53 2019 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF ENABLE/DISABLE COMMANDS SECTION ===
SMART Enabled.
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 10) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x001a 200 200 000 Old_age Always - 0
5 Reallocated_Sector_Ct 0x0033 100 100 000 Pre-fail Always - 0
9 Power_On_Hours 0x0032 097 097 000 Old_age Always - 12364
12 Power_Cycle_Count 0x0032 065 065 000 Old_age Always - 34430
169 Unknown_Apple_Attrib 0x0013 221 221 010 Pre-fail Always - 1052311028192
173 Wear_Leveling_Count 0x0032 183 183 100 Old_age Always - 1297113874815
174 Host_Reads_MiB 0x0022 099 099 000 Old_age Always - 24044320
175 Host_Writes_MiB 0x0022 099 099 000 Old_age Always - 15890436
192 Power-Off_Retract_Count 0x0012 099 099 000 Old_age Always - 537
194 Temperature_Celsius 0x0022 051 033 000 Old_age Always - 49 (Min/Max 5/67)
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
199 UDMA_CRC_Error_Count 0x001a 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.