WD Elements 2TBがあります。削除またはフォーマットしようとしましたが、成功しませんでした。 3日以上長い時間がかかりましたが、何も起こりませんでした。進行率が1％で止まっています。
また、不良セクタの確認試行が30分後も続行されません。
:~$ sudo badblocks -svw -o badblocks.log /dev/sdc
Checking for bad blocks in read-write mode
From block 0 to 1953481727
Testing with pattern 0xaa: 0.01% done, 31:34 elapsed. (0/0/0 errors)
これは（smartctl --all）の出力です。
~$ sudo smartctl --all /dev/sdd
smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.15.0-52-generic] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Elements / My Passport (USB, AF)
Device Model: WDC WD20NMVW-11AV3S2
Serial Number: WD-WX21E949F5A4
LU WWN Device Id: 5 0014ee 20b794cca
Firmware Version: 01.01A01
User Capacity: 2,000,398,934,016 bytes [2.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5200 rpm
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.0, 3.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Thu Nov 3 23:08:31 2022 +03
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
Warning: This result is based on an Attribute check.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (37620) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 415) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x7035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 49
3 Spin_Up_Time 0x0027 216 193 021 Pre-fail Always - 4166
4 Start_Stop_Count 0x0032 099 099 000 Old_age Always - 1535
5 Reallocated_Sector_Ct 0x0033 133 133 140 Pre-fail Always FAILING_NOW 2805
7 Seek_Error_Rate 0x002e 001 001 000 Old_age Always - 40614
9 Power_On_Hours 0x0032 097 097 000 Old_age Always - 2221
10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 1407
192 Power-Off_Retract_Count 0x0032 199 199 000 Old_age Always - 1370
193 Load_Cycle_Count 0x0032 187 187 000 Old_age Always - 40166
194 Temperature_Celsius 0x0022 107 101 000 Old_age Always - 45
196 Reallocated_Event_Count 0x0032 002 001 000 Old_age Always - 198
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 7 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 7 occurred at disk power-on lifetime: 2167 hours (90 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 00 00 00 00 00 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 02 00 00 00 00 00 00 00:01:23.524 SET FEATURES [Enable write cache]
ef 90 06 00 00 00 00 00 00:01:23.524 SET FEATURES [Disable SATA feature]
e1 00 02 00 00 00 00 00 00:01:23.524 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:01:23.523 IDENTIFY DEVICE
e1 00 0f 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
Error 6 occurred at disk power-on lifetime: 2167 hours (90 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 06 00 00 00 00 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 90 06 00 00 00 00 00 00:01:23.524 SET FEATURES [Disable SATA feature]
e1 00 02 00 00 00 00 00 00:01:23.524 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:01:23.523 IDENTIFY DEVICE
e1 00 0f 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
ef 02 00 00 00 00 00 00 00:01:22.579 SET FEATURES [Enable write cache]
Error 5 occurred at disk power-on lifetime: 2167 hours (90 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 02 00 00 00 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
e1 00 02 00 00 00 00 00 00:01:23.524 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:01:23.523 IDENTIFY DEVICE
e1 00 0f 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
ef 02 00 00 00 00 00 00 00:01:22.579 SET FEATURES [Enable write cache]
ef 90 06 00 00 00 00 00 00:01:22.579 SET FEATURES [Disable SATA feature]
Error 4 occurred at disk power-on lifetime: 2167 hours (90 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 0f 00 00 00 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
e1 00 0f 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
ef 02 00 00 00 00 00 00 00:01:22.579 SET FEATURES [Enable write cache]
ef 90 06 00 00 00 00 00 00:01:22.579 SET FEATURES [Disable SATA feature]
e1 00 02 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:01:22.578 IDENTIFY DEVICE
Error 3 occurred at disk power-on lifetime: 2167 hours (90 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 00 00 00 00 00 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 02 00 00 00 00 00 00 00:01:22.579 SET FEATURES [Enable write cache]
ef 90 06 00 00 00 00 00 00:01:22.579 SET FEATURES [Disable SATA feature]
e1 00 02 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:01:22.578 IDENTIFY DEVICE
b0 d0 00 00 4f c2 00 00 00:00:17.757 SMART READ DATA
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
死んでいるのか、それとも修正できますか？
PS：私はUbuntu 22.04を使用しています。
ベストアンサー1
そのディスクが死んでいます。
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
SMART属性を見てみましょう。
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
...
5 Reallocated_Sector_Ct 0x0033 133 133 140 Pre-fail Always FAILING_NOW 2805
7 Seek_Error_Rate 0x002e 001 001 000 Old_age Always - 40614
...
196 Reallocated_Event_Count 0x0032 002 001 000 Old_age Always - 198
内部的に再割り当てされたセクタの数が制限に達すると、エラーメッセージが表示されます。ディスクの少なくとも2805ブロックを読み取ることができず、ディスク自体によって内部的にスペアブロックにリダイレクトされました。
再割り当てイベントの数（生の値）は198です。これは、平均して、一度に10個以上の失敗したブロックがある地域で、これらの2805個のブロックが検出されたことを示しています。これは、ディスク表面に重大な物理的損傷がある領域がある可能性があることを示します。どのソフトウェアコマンドもこの問題を解決できません。
（たとえば、電源が入っている間にディスクがぶつかると、読み取り/書き込みヘッドが実際にディスク表面に接触し、実際の磁性材料がその領域で激しく剥がれる可能性があります。が詰まることがあります、パフォーマンスが低下したり、他の問題が発生する別の場所に着陸します。
そして、ナビゲーションエラー率（拡張値）は、失敗しきい値（しきい値は「0」にもかかわらず）からわずか1ステップ離れたように見えます。このマークが正しいと、ディスクの起動セルフテストが失敗し、いつでも完全にアクセスできなくなる可能性があります。
デフォルトでは、ディスクがまだ機能している唯一の理由は、読み取り可能な重要なデータをバックアップする最後の機会を提供するために最善を尽くしているからです。
これで、ディスクを廃棄して新しいディスクを購入するときです。その中のすべてのデータを回復できないことを確認する必要がある場合は、ディスクケースを開き、ディスクプラッタを取り外してからプラスチック製の袋に入れて（破片がある可能性があるため）、最大のハンマーで片に粉砕します。この目的でオブジェクトを簡単に使用できます。
ある人は次のように言いました（他の表現で）：「すべてのハードドライブは最終的に古くなるマシンです。データの保存は一時的な副作用です」。